CSPM5500 SPM

 Scanning Probe Microscope

 


Functions

Standard:

Atomic Force Microscope (AFM): Contact Mode,Tapping Mode, Phase Imaging

Lateral Force Microscope (LFM)

Scanning Tunneling Microscope (STM)

Curve Measurement: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve

Optional:

Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode

Magnetic Force Microscope (MFM) / Electric Force Microscope (EFM)

Enviornmental Control SPM

SPM in liquid

Conductive AFM

Enviornmental Control SPM  ......

  Environmental Control SPM

  MFM/EFM

  Best for the best!

  SPM in liquid

  Nano-Processing